Qualification Testing Of SSDs

Qualification Testing Of SSDs

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Description: This electronic presentation is about SSD Failure of 90%+ rate for SSDs that havenít been properly tested prior to the OEM Qualification Testing. Without thorough testing throughout the manufacturing process and adherence to JEDEC and SNIA certification, SSD manufacturers will likely fail OEM Qualification Testing. Let's talk about EVT, DVT, RDT, ORT, EVT is performed to ensure that the storage device meets the set design goals and specifications.

DVT is performed to deliver objective and comprehensive testing to verify product specifications, interface standards and OEM requirements. RDT demonstrates the specified life and reliability of a drive and is typically performed at the system level. ORT ensures that the quality of SSDs are of the same specifications as the day they first want into production.

JEDECís requirements for Client and Enterprise application classes are based on the following conditions like Capacity, UBER requirements, FFR needs, Data maintained when power is off. To pass most OEM Qualification Testing, manufacturerís should Thoroughly test their products throughout the manufacturing process, Attain certification from groups such as SNIA and JEDEC, Work with a qualified 3rd party testing service to ensure accurate testing results.

 
Author: Kevin Donovan (Fellow) | Visits: 2522 | Page Views: 2990
Domain:  High Tech Category: IT Subcategory: Storage 
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Contents:
Qualifying SSDs
Kevin Donovan
Vice President of Test Services
Flexstar Technology

Flash Memory Summit 2012
Santa Clara, CA

1

SSD Failure

There is 90%+ Failure rate for SSDs that haven’t been properly tested
prior to the OEM Qualification Testing

Without thorough testing throughout the manufacturing process and
adherence to JEDEC and SNIA certification, SSD manufacturers will
likely fail OEM Qualification Testing.

Flash Memory Summit 2012
Santa Clara, CA

2

Engineering Verification Testing
Engineering Verification Testing (EVT) is performed to ensure that the storage
device meets the set design goals and specifications. Here are a few of the tests
included in EVT testing:
• Power Cycling
• Voltage Margining to Failure
• Wear Leveling
EVT Testing Requires:
Ambient Test System
a capacity of 4-16 drives
a time period of up to 2 weeks

Flash Memory Summit 2012
Santa Clara, CA

3

Design Verification Testing
Design Verification Testing (DVT) is performed to deliver objective and comprehensive
testing to verify product specifications, interface standards and OEM requirements.
Here are a few of the tests included in DVT testing :
• Workload
• Access Test
• Buffer Test
DVT Testing Requires:
Burn-in Test System
a capacity of 100-200 drives
a time period of up to 4 weeks

Flash Memory Summit 2012
Santa Clara, CA

4

Reliability Demonstration Testing
Reliability Demonstration Testing (RDT) demonstrates the specified life and reliability of
a drive and is typically performed at the system level. Here are a few of the tests
included in RDT testing:
• Command Queuing
• Write Shut Off
• Buffer Test
RDT Testing Requires:
Burn-in and Environmental Test System
a capacity of 1,000 drives
a time period of 1,000 hours

Flash Memory Summit 2012
Santa Clara, CA

5

Ongoing Reliability Testing
Ongoing Reliability Testing (ORT) ensures that the quality of SSDs are of the
same specifications as the day they first went into production. Here are a
few of the tests included in ORT testing:
• Power Margining
• Power Management
• Write Shut Off
ORT Testing Requires:
Burn-in Test System
a capacity of 20-400 drives
(dependent on overall quantity)
Samples from each weekly batch

Flash Memory Summit 2012
Santa Clara, CA

6

JEDEC Certification Testing
JEDEC’s requirements for Client and Enterprise application classes are
based on the following conditions:
• Capacity
• UBER Requirements
• FFR needs
• Data maintained when power is off
JEDEC Testing Requires:
Testing on an Environmental System
a minimum capacity of 31 drives
a time period of 7 days to 6 weeks
(dependent on capacity and speed of drive)

Flash Memory Summit 2012
Santa Clara, CA

7

SNIA Testing
SNIA’s certification testing is highly dependent on SSD’s:
• prior usage
• pretest state of the device
• the testing parameters
The procedure consists of:
• IOPs Testing
• Throughput Testing
• Latency Testing
SNIA Certification Requires:
Ambient System
a time period of 700 minutes

Flash Memory Summit 2012
Santa Clara, CA

8

Qualification Testing
OEMs require manufacturers to prove that they’re providing SSDs with proven
quality and reliability. Qualification testing entails the testing of storage devices
under extreme conditions for:
• Performance
• Environmental Tolerance
• Power Consumption
• Longevity
Qualification Testing Requires:
Burn-in and Environmental Test Systems
Environmental capacity of 30-60 drives for 1- 2 weeks
Burn-in capacity of 200 for 3 weeks

Flash Memory Summit 2012
Santa Clara, CA

9

Quality Improvement @ All Phases

Design Phase

Verification

Production Integration Field

Customer

Conclusion
 To pass most OEM Qualification Testing,
manufacturer’s should:
• Thoroughly test their products throughout the
manufacturing process
• Attain certification from groups such as SNIA and
JEDEC
• Work with a qualified 3rd party testing service to
ensure accurate testing results

Flash Memory Summit 2012
Santa Clara, CA

11

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