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Affinity mass spectrometry from a tailored porous silicon surface

 Jun-cai Meng, Gary Siuzdak and M. G. Finn
  1st-Apr-2008
Views: 1504
Domain: Electronics
Category: Semiconductors
Contents:
Chem. Commun., 2004, (Advance Article)
DOI: 10.1039/b408200a

Affinity mass spectrometry from a tailored porous silicon surface
Communication Jun-cai Meng, Gary Siuzdak and M. G. Finn* Department of Chemistry, The Scripps Research Institute, 10550 N. Torrey Pines Rd., La Jolla, CA 92037, USA. E-mail: mgfinn@scripps.edu; Fax: 858-784-8850; Tel: 858-784-8845 Received (in Corvallis, OR, USA) 1st June ... See more
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01 May, 2008