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June 2007 SRC Research Highlights

 Larry Sumney
  16th-Jul-2007
Views: 1106
Domain: Electronics
Category: Semiconductors
Contents:
Research Highlights for the Month of June 2007
Computer Aided Design & Test Sciences Technical Thrust: Circuit Design Research Highlight: Progress Report This work proposes to create an open-source, variation-aware 45nm PDK for use in VLSI education and small-businesses. This kit will include the necessary layout design-rules and extraction command-decks to capture layout-dependent systematic vari ... See more
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Larry Sumney
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