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June 2007 SRC Research Highlights

 Larry W. Sumney
  16th-Jul-2007
Views: 268
Domain: Electronics
Category: Semiconductors
SEMICONDUCTOR ANALYTICS
Contents:
Research Highlights for the Month of June 2007
Computer Aided Design & Test Sciences
Technical Thrust: Circuit Design
Research Highlight: Progress Report
This work proposes to create an open-source, variation-aware 45nm PDK for use in VLSI
education and small-businesses. This kit will include the necessary layout design-rules and
extraction command-decks to capture layout-dependent systematic vari ... See more
Larry W. Sumney
03 August, 2007
Larry W. Sumney
03 August, 2007
Larry W. Sumney
03 August, 2007