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SRC GRC University Research Highlights Feb 08

 Dale Edwards, William Joyner, Kwok Ng, David Yeh, Scott List, Dan Herr
  13th-May-2008
Views: 1660
Domain: Electronics
Category: Semiconductors
Maxims of Tech: Rules of Engagement for a Fast Changing Environment
Contents:
Research Highlights for the February 2008

Computer Aided Design & Test Sciences
Technical Thrust: Logic & Physical Design Research Highlight: Circuit Simulation Engine for Variation and Electrical-Aware OPC/RET Insertion This report summarizes work on dealing with systematic variation in device parameters by understanding the variability mechanism and modeling impact of process variations on circ ... See more
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19 August, 2008