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In-line High Resolution 3D Surface Measurements for Substrate Characterization

 Erik Novak PhD
  10th-Apr-2017
Description: 4D Technology Designs Metrology for Challenging Situations:- We create innovative optical instruments for precision measurement in dynamic environments to enable discovery and drive process excellence. 4D instruments measure surface shape, roughness, defects, wavefront and polarization, enabling our customers to: Build next generation optical instruments-Space-based optical systems, Large astronomical telescopes. Improve manufacturing of industrial and consumer products. Semiconductors, displays, data storage. Flexible electronics.
Views: 635
Domain: Electronics
Category: Semiconductors
Contributing Organization: SEMICON Europa
 ‐ More of their Presentations
Maxims of Tech: Rules of Engagement for a Fast Changing Environment
Contents:
In-line High Resolution 3D Surface Measurements
for Substrate Characterization
Dr. Erik Novak
Director of Businses Development, 4D Technology

4D Technology Designs Metrology for
Challenging Situations
We create innovative optical instruments for
precision measurement in dynamic environments
to enable discovery and drive process excellence.
4D instruments measure surface shape, roughness, defects ... See more
Erik Novak PhD
07 December, 2015