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SRC GRC University Research Highlights August 2009

 William Joyner, Kwok Ng, David Yeh, Scott List, Dan Herr
  21st-Jan-2010
Views: 1628
Domain: Electronics
Category: Semiconductors
Contents:
Research Highlights for the Month of August 2009

Computer Aided Design & Test Sciences
Technical Thrust: Logic & Physical Design
Research Highlight: Supporting RTL Flow Compatibility in a Microarchitecture-Level Design Framework Current RTL-based design methodologies face significant scaling challenges related to the difficulty of designing, modifying, and verifying RTL. RTL contains primarily lo ... See more
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19 August, 2010
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19 August, 2010
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03 March, 2010