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SRC GRC University Research Highlights August 2009

 William Joyner, Kwok Ng, David Yeh, Scott List, Dan Herr
Views: 1628
Domain: Electronics
Category: Semiconductors
Research Highlights for the Month of August 2009

Computer Aided Design & Test Sciences
Technical Thrust: Logic & Physical Design
Research Highlight: Supporting RTL Flow Compatibility in a Microarchitecture-Level Design Framework Current RTL-based design methodologies face significant scaling challenges related to the difficulty of designing, modifying, and verifying RTL. RTL contains primarily lo ... See more
19 August, 2010
19 August, 2010
03 March, 2010