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SRC GRC University Research Highlights November 2009

 William Joyner, Kwok Ng, David Yeh, Scott List
  3rd-Mar-2010
Views: 2152
Domain: Electronics
Category: Semiconductors
Contents:
Research Highlights for the Month of November 2009

Computer Aided Design & Test Sciences
Technical Thrust: Test and Testability
Research Highlight: Analysis of the Impact of Linewidth Variation on Low-K Dielectric Breakdown Low-k time-dependent dielectric breakdown (TDDB) has been found to vary as a function of metal linewidth, when the distance between the lines is constant. Comb test structures ... See more
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19 August, 2010
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19 August, 2010
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19 August, 2010