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GRC University Research Highlights May 08

 Dale Edwards, William Joyner, Kwok Ng, David Yeh, R. Scott List, Daniel C. Herr
  17th-Jun-2008
Views: 1877
Domain: Electronics
Category: Semiconductors
Contents:
Research Highlights for the Month of May 2008

Computer Aided Design & Test Sciences
Technical Thrust: Logic & Physical Design
Research Highlight: Report on the Compact Resist Modeling; RET Aware Post-Routing Optimization and RET Aware Routing by Modeling Litho-Metrics into Routing Cost Nanometer VLSI design is facing increasing challenges from manufacturing limitations. These include the printabi ... See more

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