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Test Economics Driving Test Technology

 Risto Puhakka
  8th-Jun-2009
Description: This was Semiconductor Wafer Test Workshop (SWTW) keynote presentation. I covers VLSI's forecast, probe card market and observations about test economics and technology
Views: 2501
Domain: Electronics
Category: Semiconductors
Contents:
SWTW -- June 2009

Test Economics Driving Test Technology

A storm blowing into Lake McDonald. Waterton-Glacier International Peace Park World Heritage Site, Montana

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