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SRC GRC Research Highlights Sept 2007

 W. Dale Edwards, William H. Joyner, Kwok Ng, David C. Yeh, Scott List, Tim Wooldridge
Views: 1975
Domain: Electronics
Category: Semiconductors
Research Highlights for the Month of September 2007

Computer Aided Design & Test Sciences
Technical Thrust: Logic & Physical Design Research Highlight: Optimization of Lithographic Induced Variability for Improved Circuit Performance The most prevalent circuit analysis tools in industry today are deterministic, corner-based solutions. However, these analysis tools are becoming increasing conserva ... See more

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