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SRC GRC University Research Highlights December 2007

 William Joyner, Dale Edwards, Kwok Ng, David Yeh, Daniel Herr
  4th-Jan-2008
Views: 1454
Domain: Electronics
Category: Semiconductors
SEMICONDUCTOR ANALYTICS
Contents:
Research Highlights for the Month of December 2007

Computer Aided Design & Test Sciences
Technical Thrust: Test and Testability Research Highlight: Software: Deviation Computation, Test Grading, and Seed Selection This document describes the software being released as part of the project deliverables. Duke University SRC Contact: William H. Joyner (william.joyner@src.org) Technical Thrust: Verifi ... See more
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04 January, 2008