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Yield Learning with Layout-aware Advanced Scan Diagnosis

 Jayanth Mekkoth, Murali Krishna, Jun Qian, Will Hsu, Chien-Hui Chen, Yuan-Shih Chen, Nagesh Tamarapa
Views: 1922
Domain: Electronics
Category: Semiconductors
Proceedings of the 32nd International Symposium for Testing and Failure Analysis November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA

Yield Learning with Layout-aware Advanced Scan Diagnosis
Jayanth Mekkoth, Murali Krishna, and Jun Qian Cisco Systems Inc., San Jose CA USA Will Hsu, Chien-Hui Chen, and Yuan-Shih Chen Taiwan Semiconductor Manufacturing Company, Hsinchu Taiwan R.O.C. N ... See more

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