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Thin Film Thickness Measurement With 3D Metrology

Description: Thin film thickness control is highly important to the manufacturing process of various highly demanded applications. The ideal technique for assuring this control would be a highly accurate, non-contact, high speed measurement with no disturbance from transparent and or reflective surfaces.
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Domain: Energy
Category: Photovoltaics/Solar
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Thin Film Thickness Measurement With 3D Metrology

Prepared by Craig Leising

6 Morgan, Ste156, Irvine CA 92618 � P: 949.461.9292 � F: 949.461.9232 � nanovea.com
Today's standard for tomorrow's materials. � 2010 NANOVEA

Thin-film deposition is the act of applying a thin film to a surface, any technique for depositing a thin film of material ... See more

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